The Bruker Optics` Cryogenic Silicon Analysis System (CryoSAS) is a dedicated all-in-one system for the low temperature (<15K) impurity analysis of Silicon. CryoSAS is optimized for operation in the industrial environment. CryoSAS combines Bruker's high performance FTIR spectrometers with built-in, closed-cycle cryo-cooling technique that does not require any liquid Helium. All CryoSAS components are state-of-the-art, yet utilize proven technologies to accomplish a difficult analysis in the demanding silicon production environment. CryoSAS can be operated at a high level of automation including accurate reporting of the analysis results. CryoSAS analyzes shallow impurities (e.g. Boron, Phosphorous etc.) down to the low ppta level according to the ASTM/SEMI MF1630 standard. Furthermore it simultaneously analyzes Carbon and Oxygen down to the low ppba level according to the ASTM/SEMI MF1391 standard. CryoSAS is optimized for operation in the industrial environment. All vacuum and refrigeration devices are controlled by a PLC. Cooling down and starting the measurement is a simple push button operation.